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发表于 2009-1-24 10:00:00
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IEC在2009年出版的一本新书:Signal Integrity Characterization Techniques
ISBN: 1-931695-93-8 ISBN: 978-1-931695930
Signal Integrity Characterization Techniques Description: Signal Integrity Characterization Techniques addresses the gap between traditional digital and microwave measurement technologies while focusing on a practical and intuitive understanding of signal integrity effects within the data transmission channel. High-speed interconnects such as connectors, PCBs, cables, IC packages, and backplanes are critical elements of differential channels that must now be optimized using today’s most powerful analysis and characterization tools. Both measurements and simulation must be done on the device under test and must yield data that correlates with each other. Most of this book focuses on real-world applications of signal integrity measurements—from backplane design challenges to advanced error correction techniques to jitter measurement tools. The authors’ approach wisely address many of today’s high-speed technologies, provides excellent insight into its future direction, and will teach the reader valuable lessons pertaining to the signal integrity industry.
ABOUT THE AUTHORS Mike Resso is a signal integrity application specialist in the component test division of Agilent Technologies. He is responsible for the technical training of field engineers, symposium lecturing, and the creation of sales tools that will expand the worldwide market growth of high bandwidth oscilloscopes. His current activities include developing novel signal integrity measurement techniques related to high-speed digital design applications, identifying new test methodologies in the communications field, and interfacing with Agilent R&D engineers to bring innovative products to the marketplace. He has over twenty years experience in the test and measurement industry, and his background includes the design and development of electro-optic test instrumentation for aerospace and commercial applications. His most recent activity has focused on the complete multiport characterization of high speed digital interconnects using time domain reflectometry and vector network analysis. He has authored over 20 technical papers in diverse fields such as infrared detector probe systems, linearly variable optical filters, and electrically conductive antireflection coatings. Mike received a B.S. degree in electrical and computer engineering from University of California. Eric Bogatin is signal integrity evangelist of Bogatin Enterprises, LLC which specializes in training for signal integrity and interconnect design. His company offers a complete curriculum in short courses and training materials to help accelerate engineers and managers up the learning curve to be more effective in fields related to signal integrity. He has held senior engineering and management positions at such companies as AT&T Bell Labs, Raychem Corporation, Advanced Packaging Systems, and Sun Microsystems. For 20 years, he has been involved in various aspects of signal integrity and inter-connect design, from the materials side, manufacturing, product design, measurements and, most recently, education and consulting. Eric has written four books on signal integrity and inter-connect design, over 200 papers, and most recently wrote a book entitled Signal Integrity-Simplified published in 2004. Eric received his Ph.D. in physics from the University of Arizona in Tucson in 1980 and his B.S. in physics from the Massachusetts Institute of Technology in 1976.
Contents: Part I: Getting Started – Introducing TDR and VNA Techniques and the Power of S-Parameters Chapter 1: Signal-Port TDR, TDR/TDT, and Two-Port TDR: Interconnect Analysis is Simplified with Physical Layer Tools Eric Bogatin, President, Bogatin Enterprises Mike Resso, Signal Integrity Applications Scientist, Component Test Division, Agilent Technologies 1.1: Introduction 1.2: Single-Port TDR 1.3: Two-Port TDR/TDT 1.4: Two-Port TDR/Crosstalk 1.5: Two-Port Differential TDR (DTDR) Chapter 2: 4-Port TDR/VNA/PLTS – Interconnect Analysis Is Simplified with Physical Layer Test Tools Eric Bogatin, President, Bogatin Enterprises Mike Resso, Signal Integrity Applications Scientist, Component Test Division, Agilent Technologies 2.1: Introduction 2.2: Four-Port Techniques 2.3: Summary Chapter 3: Differential Impedance Design and Verification with Time Domain Reflectometry Eric Bogatin, President, Bogatin Enterprises Mike Resso, Product Manager, Lightwave Division, Agilent Technologies 3.1: Abstract 3.2: Overview 3.3: Summary Chapter 4: Utilizing TDR and VNA Data to Develop Four-Port Frequency-Dependent Models Jim Mayrand, Signal Integrity Consultant Mike Resso, Product Manager, Signal Integrity Operation, Agilent Technologies Dima Smolyansky, TDA Systems 4.1: Abstract 4.2: Signal Integrity Challenges 4.3: Trend to Differential Topologies 4.4: Model Extraction Methodologies 4.5: Typical Four-Port Measurement Systems 4.6: Understanding Four-Port Mixed-Mode Analysis 4.7: Differential Interconnect Analysis 4.8: Measurement Accuracy and Error Correction 4.9: Design Case Study: Silicon Pipe Channel Plane 4.10: Frequency and Time Domain Analysis 4.11: Partitioning the Impedance Profile 4.12: Correlating Measurements and Models 4.13: HSpice Subcircuit Model for Backplane Only 4.14: Discontinuities: Flush Connector versus Cable Break 4.15: HSpice Subcircuit Model for Backplane Flush Connector 4.16: Model Optimization Schematic: Cable and Connector 4.17: Analyzing Connector Shunt Loss 4.18: Analyzing Fringe Capacitance 4.19: Modeled S-Parameters from Simulated TDR Waveforms 4.20: Modeled Eye Diagram with and without Connectors 4.21: Conclusion Chapter 5: Accuracies and Limitations of Time and Frequency Domain Analyses of Physical-Layer Devices Robert Schaefer, Technical Leader and R&D Project Manager, Signal Integrity Group, Agilent Technologies 5.1: Introduction 5.2: Equipment Setup 5.3: Fundamental Differences between TDR and VNA Instruments 5.4: TDR and VNA Sources 5.5: Architectures and Sources of Error 5.6: Calibration and Normalization 5.7: Measurement Accuracies: Reciprocity, Repeatability, and Drift 5.8: Measurement Comparisons 5.9: Summary Chapter 6: Data Mining 12-Port S-Parameters Eric Bogatin, President, Bogatin Enterprises Mike Resso, Signal Integrity Application Scientist, Component Test Division, Agilent Technologies 6.1: Abstract 6.2: High-Speed Serial Links and the Bandwidth of Interconnects 6.3: Four-Port S-Parameters 6.4: Twelve-Port S-Parameters and Information Overload 6.5: Serial-Link Performance Analysis 6.6: Losses 6.7: Impedance Continuities 6.8: Mode Conversion 6.9: Channel-to-Channel Crosstalk 6.10: Conclusion Part II: Backplane Measurements and Analysis Chapter 7: A Design of Experiments for Gigabit Serial Backplane Channels Jack Carrel, System IO Specialist, Xilinx Bill Dempsey, Owner and President, Redwire Enterprises Mike Resso, Signal Integrity Application Scientist, Component Test Division, Agilent Technologies 7.1: Abstract 7.2: Introduction 7.3: Serial Backplane Channels 7.4: Backplane Platform Description 7.5: Daughtercard Description 7.6: Backplane Characterization 7.7: eHSD Connection Channels 7.8: HM-Zd Channels 7.9: HM-Zmm Channels 7.10: Crosstalk Measurements 7.11: Eye Diagram Analysis 7.12: Reference Channels 7.13: Summary Chapter 8: Gigabit Backplane Design, Simulation, and Measurement: The Unabridged Story Edward Sayre, Owner and Director, NESA Jinhua Chen, Signal Integrity and EMI Engineer, NESA Michael Baxter, Signal Integrity Engineer, NESA Gautam Patel, Signal Integrity Engineer, New Product Development, Teradyne John Goldie, Member of the Technical Staff, National Semiconductor Mike Resso, Product Manager, Lightwave Division, Agilent Technologies 8.1: Introduction 8.2: Gigabit Backplane Design Case Study 8.3: Simulations 8.4: Measurements 8.5: Recommendations 8.6: Summary Part III: Assuring Quality Measurements = Probing and De-Embedding Chapter 9: The ABCs of De-Embedding Eric Bogatin, President, Bogatin Enterprises Mike Resso, Signal Integrity Applications Scientist, Component Test Division, Agilent Technologies 9.1: Introduction 9.2: Why De-Embedding? 9.3: Principles of De-Embedding 9.4: Obtaining the S-Parameter of the Fixture 9.5: Direct Measurement of Fixture S-Parameters 9.6: Building the Fixture S-Parameter by Fitting a Model to Measurement Data 9.7: Simulating the Fixture S-Parameter with a 3D Field Solver 9.8: Summary Chapter 10: Backplane Differential Channel Microprobe Characterization in Time and Frequency Domains Eric Bogatin, Chief Technologial Officer, GigaTest Labs Mike Resso, Signal Integrity Operation, Agilent Technologies 10.1: Abstract 10.2: Differential Channels Will Proliferate 10.3: The Bottleneck of SMAs 10.4: Advantages of Microprobing 10.5: Design for Test 10.6: Physical Layer Characterization 10.7: Understanding Four-Port Mixed-Mode Analysis 10.8: Design Case Study: XAUI Backplane 10.9: Comparing Time Domain and Frequency Domain Data 10.10: Coupling Pulls Down Differential Impedence 10.11: Eye Diagram Simulation Using Four-Port S-Parameters 10.12: Non-Ideal Differential Signaling (AKA Mode Conversion) 10.13: Summary Chapter 11: Differential PCB Structures Using Measured TRL Calibration and Simulated Structure De-Embedding Heidi Barnes, High-Frequency Device Interface Board Designer, Verigy, Inc. Antonio Ciccomancini, Application Engineer, CST of America, Inc. Mike Resso, Signal Integrity Applications Scientist, Component Test Division, Agilent Technologies Ming Tsai, Staff Hardware Development Engineer, Production Technology Division, Xilinx 11.1: Abstract 11.2: Introduction 11.3: Combined TRL Calibration and Simulated Structure De-Embedding for Multi-Mode N-Port Systems 11.4: TRL Calibration Structures and Measurement Technique 11.5: Simulated Four-Port and 12-Port De-Embedding Structure 11.6: Device Structure under Test: Coupled and Un-Coupled via Pairs 11.7: Verification Using Four-Port Multimode TRL Calibration 11.8: Demonstration of the Combined TRL Calibration and Simulated Structure De-Embedding Technique for Multi-Mode N-Port System 11.9: Summary and Conclusion Chapter 12: Validating Transceiver FPGAs Using Advanced Calibration Techniques Mike Resso, Business Development Manager, Signal Integrity Applications, Agilent Technologies Hong Shi, Member of Technical Staff, Packing Technology, Altera 12.1: Abstract 12.2: Introduction 12.3: FPGA Applications Overview 12.4: Systematic Error Correction 12.5: Characterizing Differential Structures 12.6: Design Case Study 12.7: Conclusion Chapter 13: Performance at the DUT: Techniques for Evaluating the Performance of an ATE System at the DUT Socket Heidi Barnes, Senior Application Consultant, Verigy José Moreira, Senior Application Consultant, Verigy Michael Comai, Senior Product Engineer, AMD Abraham Islas, Senior Product Engineer, AMD Francisco Tamayo-Broes, Product Development Engineer, AMD Mike Resso, Signal Integrity Measurement Specialist, Component Test Division, Agilent Technologies Antonio Ciccomancini, Application Engineer, CST Orlando Bell, Vice President, Engineering, GigaTest Labs Ming Tsai, Principal Engineer, RF Design Group, Amalfi Semiconductor 13.1: Abstract 13.2: Introduction 13.3: Probing Technology, Interposer Design, and Mechanical Challenges 13.4: Calibration Techniques 13.5: Measuring the Probe and Probe Interposer Adapter 13.6: Test Fixture Performance Measurement 13.7: Focus Calibration on an ATE System: Measuring “at the DUT” 13.8: Conclusion Chapter 14: Frequency Domain Calibration: A Practical Approach for the Serial Data Designer Steven Corey, Principal Engineer, Electro-Optical Product Line, Tektronix Eric Bogatin, President, Bogatin Enterprises Dima Smolyansky, Product Marketing Manager, Tektronix 14.1: Abstract 14.2: Characterization of Serial Channels 14.3: Calibration Methods 14.4: Frequency Limits from Time Domain Measurements 14.5: Intrinsic Performance Limits 14.6: Variation in Typical Fixtures 14.7: Conclusion Chapter 15: Practical Design and Implementation of Stripline TRL Calibration Fixtures for 10-Gigabit Interconnect Analysis Vince Duperron, Design Engineer, Molex Dave Dunham, Electrical Engineer Manager, Molex Mike Resso, Product Manager, Signal Integrity Applications, Agilent Technolgies 15.1: Abstract 15.2: Introduction 15.3: Why Calibrate? 15.4: Linear Two-Port Network Analyzer Measurements 15.5: VNA Measurement Errors 15.6: Vector Network Analyzer with Four Ports 15.7: A Real-World VNA Block Diagram Example: The Agilent N5230A-245 15.8: TRL Calibration Types 15.9: A Stripline TRL Fixture—A Design Case Study 15.10: The Macro Element View 15.11: Putting It Together 15.12: The Micro-Half of a TRL Design 15.13: Validation of TRL Fixtures 15.14: Using the Corrected Material Properties 15.15: Conclusion Chapter 16: Channel Compliance Testing Utilizing Novel Statistical Eye Methodology Anthony Sanders, Principal Engineer, Infineon Mike Resso, Product Manager, Agilent Technologies John D’Ambrosia, Manager, Semiconductor Relations, Tyco Electronics 16.1: Abstract 16.2: Introduction 16.3: StatEye Methodology 16.4: Cascading of Channel with Transmitter and Receiver Return Loss Model 16.5: Design Example Results 16.6: Conclusion Chapter 17: Characterizing Jitter Performance on High-Speed Digital Devices Using Innovative Sampling Technology Osvaldo Buccafusca, Development Scientist, Lightwave Division, Agilent Technologies Mike Resso, Product Manager, Agilent Technologies 17.1: Abstract 17.2: Introduction 17.3: Jitter Measurement 17.4: Random Sampling and Precision Time Base 17.5: Future Trends: Optical Sampling 17.6: Summary Chapter 18: Signal Integrity Concerns When Modulating Laser Transmitters at Gigabit Rates Stephen Reddy, Senior Design Engineer, Transmission Subsystems Group, JDS Uniphase Laurie Taira, Senior Product Engineer, Research and Development, Delphi Connection Systems Mike Resso, Product Manager, Lightwave Division, Agilent Technologies Chapter 19: The Role of Dielectric Constant and Dissipation Factor Measurements in Multi-Gigabit Systems Eric Bogatin, President, Bogatin Enterprises Shelley Begley, Team Leader, Agilent Technologies Mike Resso, Signal Integrity Applications Scientist, Component Test Division, Agilent Technologies 19.1: Abstract 19.2: Introduction 19.3: Dielectric Properties of Laminates 19.4: Impact of Dielectic Materials in Signal Integration 19.5: Measurement Methods 19.6: Split-Post Dielectic Resonator Method 19.7: Conclusion Chapter 20: Designing Scalable 10G Backplane Interconnect Systems Utilizing Advanced Verification Methodologies Kevin Grundy, Chief Executive Officer, SiliconPipe Haw-Jyh Liaw, Director, Systems Engineering, Aeluros Gary Otonari, Engineering Project Manager, GigaTest Labs Mike Resso, Business Development Manager, Signal Integrity Operation, Agilent Technologies 20.1: Abstract 20.2: Approach 20.3: Current Design Impediments and Approaches 20.4: AE1002 Equalization 20.5: Improving the Channel 20.6: Initial Functional Testing 20.7: Full System Analysis 20.8: Summary Chapter 21: Investigating Microvia Technology for 10 Gbps and Higher Telecommunications Systems Mike Resso, Business Development Manager, Signal Integrity Applications, Agilent Technologies Thomas Gneiting, Founder, AdMOS Advanced Modeling Roland Mödinger, Senior Engineer, ERNI Electroapparate GmbH Jason Roe, Application Engineer, ERNI Electroapparate GmbH 21.1: Abstract 21.2: Introduction 21.3: Telecom System Physical Layer Overview 21.4: Signal Integrity and Differential Signaling Backplane Data 21.5: Four Port Microvia Measurements 21.6: Microvia Construction 21.7: Modeling and Simulation Case Study 21.8: Summary and Conclusions Chapter 22: ATE Interconnect Performance to 43 Gbps Using Advanced PCB Materials Heidi Barnes, Senior Application Consultant, Verigy José Moreira, Senior Application Consultant, Verigy Tom McCarthy, Vice President, Taconic William Burns, Senior Applications Engineer, Altanova Corporation Crescencio Gutierrez, Engineering and Research and Development Manager, Harbor Electronics Mike Resso, Signal Integrity Measurement Specialist, Agilent Technologies 22.1: Abstract 22.2: Introduction 22.3: Dielectic Materials for ATE Test Fixtures 22.4: The Taconic Fast-Rise Dielectic Materials 22.5: Experimental Results 22.6: Equalization to the Rescue 22.7: NEXT/FEXT Crosstalk Variations with PCB Materials 22.8: Dielectric Influence on Complex ATE Test-Fixture Stack-Up Decisions 22.9: Conclusion Part VI: Future Directions Chapter 23: Design and Test Challenges Facing Next-Generation 20 Gbps Interconnects Jay Diepenbrock, Senior Technical Staff Member, Interconnect Qualification Engineering, IBM Will Miller, Vice President, Engineering, Efficere Technologies Mike Resso, Signal Integrity Applications Scientist, Component Test Division, Agilent Technologies 23.2: The Need to Measure Signal Integrity 23.3: Signal Integrity Analysis 23.4: High-Performance Test Figures 23.5: Test Fixtures: A User’s Perspective 23.6: Conclusion Author Biographies |
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